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Title: Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat

Abstract

As it is considered economically favorable to serially connect modules to build arrays with high system voltage, it is necessary to explore potential long-term degradation mechanisms the modules may incur under such electrical potential. We performed accelerated lifetime testing of multicrystalline silicon PV modules in 85 degrees C/ 85% relative humidity and 45 degrees C/ 30% relative humiditywhile placing the active layer in either positive or negative 600 V bias with respect to the grounded module frame. Negative bias applied to the active layer in some cases leads to more rapid and catastrophic module power degradation. This is associated with significant shunting of individual cells as indicated by electroluminescence, thermal imaging, and I-V curves. Mass spectroscopy resultssupport ion migration as one of the causes. Electrolytic corrosion is seen occurring with the silicon nitride antireflective coating and silver gridlines, and there is ionic transport of metallization at the encapsulant interface observed with damp heat and applied bias. Leakage current and module degradation is found to be highly dependent upon the module construction, with factors such asencapsulant and front glass resistivity affecting performance. Measured leakage currents range from about the same seen in published reports of modules deployed in Florida (USA) andmore » is accelerated to up to 100 times higher in the environmental chamber testing.« less

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1018865
Report Number(s):
NREL/CP-5200-49344
TRN: US201114%%376
DOE Contract Number:  
AC36-08GO28308
Resource Type:
Conference
Resource Relation:
Conference: Presented at the 25th European Photovoltaic Solar Energy Conference and Exhibition, 6-10 September 2010, Valencia, Spain
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 42 ENGINEERING; COATINGS; CONSTRUCTION; ELECTROCHEMICAL CORROSION; ELECTROLUMINESCENCE; GLASS; HUMIDITY; LEAKAGE CURRENT; LIFETIME; MASS SPECTROSCOPY; PERFORMANCE; SILICON; SILICON NITRIDES; SILVER; TESTING; TRANSPORT; multicrystalline silicon; module; reliability

Citation Formats

Hacke, P, Kempe, M, Terwilliger, K, Glick, S, Call, N, Johnston, S, and Kurtz, S. Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat. United States: N. p., 2011. Web.
Hacke, P, Kempe, M, Terwilliger, K, Glick, S, Call, N, Johnston, S, & Kurtz, S. Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat. United States.
Hacke, P, Kempe, M, Terwilliger, K, Glick, S, Call, N, Johnston, S, and Kurtz, S. Fri . "Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat". United States. https://www.osti.gov/servlets/purl/1018865.
@article{osti_1018865,
title = {Characterization of Multicrystalline Silicon Modules with System Bias Voltage Applied in Damp Heat},
author = {Hacke, P and Kempe, M and Terwilliger, K and Glick, S and Call, N and Johnston, S and Kurtz, S},
abstractNote = {As it is considered economically favorable to serially connect modules to build arrays with high system voltage, it is necessary to explore potential long-term degradation mechanisms the modules may incur under such electrical potential. We performed accelerated lifetime testing of multicrystalline silicon PV modules in 85 degrees C/ 85% relative humidity and 45 degrees C/ 30% relative humiditywhile placing the active layer in either positive or negative 600 V bias with respect to the grounded module frame. Negative bias applied to the active layer in some cases leads to more rapid and catastrophic module power degradation. This is associated with significant shunting of individual cells as indicated by electroluminescence, thermal imaging, and I-V curves. Mass spectroscopy resultssupport ion migration as one of the causes. Electrolytic corrosion is seen occurring with the silicon nitride antireflective coating and silver gridlines, and there is ionic transport of metallization at the encapsulant interface observed with damp heat and applied bias. Leakage current and module degradation is found to be highly dependent upon the module construction, with factors such asencapsulant and front glass resistivity affecting performance. Measured leakage currents range from about the same seen in published reports of modules deployed in Florida (USA) and is accelerated to up to 100 times higher in the environmental chamber testing.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {7}
}

Conference:
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