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Title: Radiation-induced off-state leakage current in commercial power MOSFETs.

Conference ·
OSTI ID:988971

Research Organization:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
988971
Report Number(s):
SAND2005-0868C
Resource Relation:
Conference: Proposed for presentation at the 2005 IEEE Nuclear and Space Radiation Effects Conference held July 11-15, 2005 in Seattle, WA.
Country of Publication:
United States
Language:
English

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