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Title: Method for detecting a mass density image of an object

Abstract

A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitted from the crystal analyzer onto a detector and digitized. A first image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a first angular position. A second image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a second angular position. A refraction image is obtained and a regularized mathematical inversion algorithm is applied to the refraction image to obtain a mass density image.

Inventors:
 [1];  [2]
  1. Chicago, IL
  2. Westmont, IL
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
985693
Patent Number(s):
7,469,037
Application Number:
US patent applicaiton 11/732,343
Assignee:
BNL
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Wernick, Miles N, and Yang, Yongyi. Method for detecting a mass density image of an object. United States: N. p., 2008. Web.
Wernick, Miles N, & Yang, Yongyi. Method for detecting a mass density image of an object. United States.
Wernick, Miles N, and Yang, Yongyi. Tue . "Method for detecting a mass density image of an object". United States. https://www.osti.gov/servlets/purl/985693.
@article{osti_985693,
title = {Method for detecting a mass density image of an object},
author = {Wernick, Miles N and Yang, Yongyi},
abstractNote = {A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitted from the crystal analyzer onto a detector and digitized. A first image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a first angular position. A second image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a second angular position. A refraction image is obtained and a regularized mathematical inversion algorithm is applied to the refraction image to obtain a mass density image.},
doi = {},
url = {https://www.osti.gov/biblio/985693}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2008},
month = {12}
}

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Works referenced in this record:

Diffraction enhanced imaging contrast mechanisms in breast cancer specimens
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Prototype grooved and spherically bent Si backscattering crystal analyzer for meV resolution inelastic x‐ray scattering
journal, February 1995


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Method of phase-dispersion introscopy
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journal, July 1985


Maximum Likelihood from Incomplete Data Via the EM Algorithm
journal, September 1977


Wave-optical description of X-ray phase contrast images of weakly absorbing non-crystalline objects
journal, February 1997


X-ray plane-wave topography observation of the phase contrast from a non-crystalline object
journal, November 1995


A bent Laue crystal monochromator for monochromatic radiography with an area beam
journal, November 1997

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