Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays
Patent
·
OSTI ID:1175504
A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within the transmitted beam. The intensity measurements of the transmitted beam are obtained by a crystal analyzer positioned at a plurality of angular positions. The plurality of intensity measurements are used to determine the angular intensity spectrum of the transmitted beam. One or more parameters, such as an attenuation property, a refraction property and a scatter property, can be obtained from the angular intensity spectrum and used to display an image of the object.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-76CH00016
- Assignee:
- Illinois Institute of Technology (Chicago, IL)
- Patent Number(s):
- 6,947,521
- Application Number:
- 10/463,827
- OSTI ID:
- 1175504
- Country of Publication:
- United States
- Language:
- English
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