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Method for detecting a mass density image of an object

Patent ·
OSTI ID:985693

A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an angle of incidence upon a crystal analyzer. A diffracted beam is emitted from the crystal analyzer onto a detector and digitized. A first image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a first angular position. A second image of the object is detected from the diffracted beam emitted from the crystal analyzer when positioned at a second angular position. A refraction image is obtained and a regularized mathematical inversion algorithm is applied to the refraction image to obtain a mass density image.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-98CH10886
Assignee:
BNL
Patent Number(s):
7,469,037
Application Number:
US patent applicaiton 11/732,343
OSTI ID:
985693
Country of Publication:
United States
Language:
English

References (10)

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  • Zhong, Z.; Chapman, D.; Thomlinson, W.
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journal November 1997