HRTEM Characterization of Interface Between Iso-Structural Thin Solid Film and Substrate
Journal Article
·
· Microscopy and Microanalysis, 8(Suppl S02):1160-1161
OSTI ID:985097
Alpha-Fe₂O₃ and c-CeO₂ thin films have been epitaxially grown on alpha-Al₂O₃ and yttria- stabilized c-ZrO₂ substrates, respectively, by oxygen plasma assisted molecular beam epitaxy (OPA-MBE). The interface structural features between the films and the substrates were characterized by high resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), Rutherford backscattering spectrometry (RBS), and x-ray diffraction (XRD). For the two systems studied, the interfaces are similarly characterized by coherent regions that are separated by misfit dislocations periodically distributed along the interface. These results will be presented along with the results from molecular dynamics (MD) simulations of these interfaces.
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (US)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 985097
- Report Number(s):
- PNNL-SA-35973; KP1704020
- Journal Information:
- Microscopy and Microanalysis, 8(Suppl S02):1160-1161, Journal Name: Microscopy and Microanalysis, 8(Suppl S02):1160-1161 Journal Issue: S02 Vol. 8
- Country of Publication:
- United States
- Language:
- English
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