Biaxial Thermal Creep of V-4Cr-4Ti AT 700C and 800C
Book
·
OSTI ID:984285
A study of the thermal creep properties of V-4Cr-4Ti was performed using pressurized tube specimens. Creep tubes nominally 4.57 mm OD by 0.25 mm wall thickness were pressurized with high-purity helium gas to mid-wall effective stresses below the uniaxial yield strength. Specimens were heated to 700 and 800C in an ultra-high vacuum furnace and periodically removed to measure the change in OD with a high-precision laser profilometer. The secondary creep rate was found to be power-law dependent on the applied stress with a stress exponent of 3.7 at 700C and 2.7 at 800C. The average activation energy for creep of V-4Cr-4Ti was 299 kJ/mole, which is quite close to the activation energy for self-diffusion in pure vanadium in this temperature regime. The predominant mechanism of creep deformation for the conditions employed in this study is most likely climb assisted dislocation motion.
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (US)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 984285
- Report Number(s):
- PNNL-SA-31875; AT6020100
- Country of Publication:
- United States
- Language:
- English
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