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Development of a Spatially Resolving X-Ray Crystal Spectrometer (XCS) for Measurement of Ion-Temperature (Ti) and Rotation-Velocity (v) Profiles in ITER

Technical Report ·
DOI:https://doi.org/10.2172/981711· OSTI ID:981711

Imaging XCS arrays are being developed as a US-ITER activity for Doppler measurement of Ti and v profiles of impurities (W, Kr, Fe) with ~7 cm (a/30) and 10-100 ms resolution in ITER. The imaging XCS, modeled after a PPPL-MIT instrument on Alcator C-Mod, uses a spherically bent crystal and 2d x-ray detectors to achieve high spectral resolving power (E/dE>6000) horizontally and spatial imaging vertically. Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. Measurement of many spatial chords permits tomographic inversion for inference of local parameters. The instrument design, predictions of performance, and results from C-Mod will be presented.

Research Organization:
Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)
Sponsoring Organization:
USDOE; USDOE Office of Science (SC)
OSTI ID:
981711
Report Number(s):
PPPL-4519
Country of Publication:
United States
Language:
English