Development of a spatially resolving x-ray crystal spectrometer for measurement of ion-temperature (T[sub i]) and rotation-velocity (v) profiles in ITER

Journal Article · Fri Jan 01 00:00:00 EST 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.2172/1001672· OSTI ID:1001672

Hill, K. W.; Bitter, M.; Delgado-Aparicio, L.; Johnson, D.; Feder, R.; Beiersdorfer, P.; Dunn, J.; Morris, K.; Wang, E.; Reinke, M.; Podpaly, Y.; Rice, J. E.; Barnsley, R.; O’Mullane, M.; Lee, S. G.

Imaging x-ray crystal spectrometer XCS arrays are being developed as a US-ITER activity for Doppler measurement of Ti and v profiles of impurities (W, Kr, and Fe) with ~ 7 cm (a/30) and 10-100 ms resolution in ITER. The imaging XCS, modeled after a prototype instrument on Alcator C-Mod, uses a spherically bent crystal and 2D x-ray detectors to achieve high spectral resolving power (E / dE > 6000) horizontally and spatial imaging vertically. Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. The measurement of many spatial chords permits tomographic inversion for the inference of local parameters. The instrument design, predictions of performance, and results from C-Mod are presented.

• Research Organization: Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: ACO2-09CH11466
• OSTI ID: 1001672
• Report Number(s): PPPL-4581; RSINAK; TRN: US1101043
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 10; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
DESIGN
IMPURITIES
ION TEMPERATURE
PERFORMANCE
PLASMA DIAGNOSTICS
RESOLUTION
ROTATION
SPECTROMETERS
VELOCITY
ITER