Development of a spatially resolving x-ray crystal spectrometer for measurement of ion-temperature (T[sub i]) and rotation-velocity (v) profiles in ITER
Imaging x-ray crystal spectrometer XCS arrays are being developed as a US-ITER activity for Doppler measurement of Ti and v profiles of impurities (W, Kr, and Fe) with ~ 7 cm (a/30) and 10-100 ms resolution in ITER. The imaging XCS, modeled after a prototype instrument on Alcator C-Mod, uses a spherically bent crystal and 2D x-ray detectors to achieve high spectral resolving power (E / dE > 6000) horizontally and spatial imaging vertically. Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. The measurement of many spatial chords permits tomographic inversion for the inference of local parameters. The instrument design, predictions of performance, and results from C-Mod are presented.
- Research Organization:
- Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- OSTI ID:
- 1001672
- Report Number(s):
- PPPL--4581
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 81; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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Development of a spatially resolving x-ray crystal spectrometer for measurement of ion-temperature (T{sub i}) and rotation-velocity (v) profiles in ITER
A Spatially Resolving X-ray Crystal Spectrometer for Measurement of Ion-temperature and Rotation-velocity Profiles on the AlcatorC-Mod Tokamak