Effects of FIB milling and pre-straining on the microstructure of directionally solidified Mo pillars: a Laue diffraction analysis

Journal Article · Thu Dec 31 23:00:00 EST 2009 · Scripta Materialia

DOI:https://doi.org/10.1016/j.scriptamat.2010.02.013· OSTI ID:979296

Zimmermann, Julien ^[1]; Van Petegem, S. ^[1]; Bei, Hongbin ^[2]; Grolimund, D. ^[1]; George, Easo P ^[2]; Van Swygenhoven, H. ^[1]

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1. Paul Scherrer Institut, Villigen, Switzerland
2. ORNL

White beam Laue micro-diffraction was performed on directionally solidified, single-crystal Mo pillars in the as-grown state, after focused ion beam (FIB) milling and after pre-straining. The Laue diffraction peaks from the as-grown pillars are very sharp and show no broadening, similar to those from single-crystal Si wafers. Significant broadening and streaking of the peaks occurred after FIB milling and pre-straining, indicative of the damage these treatments induce in the nearly perfect crystal structure of the directionally solidified Mo pillars.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 979296
• Journal Information: Scripta Materialia, Journal Name: Scripta Materialia Journal Issue: 10 Vol. 62; ISSN 1359-6462; ISSN SCMAF7
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CRYSTAL STRUCTURE
DIFFRACTION
ION BEAMS
MICROSTRUCTURE
MILLING