Depth resolved luminescence from oriented ZnO nanowires.
We have utilized the limited penetration depth of x-rays to study the near-surface properties of vertically aligned ZnO nanowires. For an energy of 600 eV the penetration depth varies between 3 and 132 nm as the incidence angle changes from 2{sup o} to 33{sup o}. Thus, by obtaining optical luminescence spectra as a function of incidence angle, it is possible to probe the near-surface region with nanometer-scale resolution. We will present angle dependent optical luminescence data from oriented ZnO nanowires. By fitting the results to a simple model, we extract a depth for the surface defect regions of -14 nm.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 977364
- Report Number(s):
- ANL/XSD/JA-65337; APPLAB; TRN: US201009%%711
- Journal Information:
- Appl. Phys. Lett., Vol. 95, Issue Dec. 14, 2009; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- ENGLISH
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