Depth resolved luminescence from oriented ZnO nanowires.

Journal Article · Mon Dec 14 04:00:00 EST 2009 · Appl. Phys. Lett.

DOI:https://doi.org/10.1063/1.3275000· OSTI ID:977364

Rosenberg, R A; Abu Haija, M; Vijayalakshmi, K; Zhou, J; Xu, S; Wang, Z L

We have utilized the limited penetration depth of x-rays to study the near-surface properties of vertically aligned ZnO nanowires. For an energy of 600 eV the penetration depth varies between 3 and 132 nm as the incidence angle changes from 2{sup o} to 33{sup o}. Thus, by obtaining optical luminescence spectra as a function of incidence angle, it is possible to probe the near-surface region with nanometer-scale resolution. We will present angle dependent optical luminescence data from oriented ZnO nanowires. By fitting the results to a simple model, we extract a depth for the surface defect regions of -14 nm.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 977364
• Report Number(s): ANL/XSD/JA-65337
• Journal Information: Appl. Phys. Lett., Journal Name: Appl. Phys. Lett. Journal Issue: Dec. 14, 2009 Vol. 95; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DEFECTS
INCIDENCE ANGLE
LUMINESCENCE
PENETRATION DEPTH
PROBES
RESOLUTION
SPECTRA