Microstructural development and control in YBa[sub 2]Cu[sub 3]O[sub y]
- Terry G.
- Brady J.
- Stephen R.
- Paul N.
- James R.
- James Y.
A study of some defect structures in Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7} (Y-123)coated conductors based on ion-beam -assisted-deposition (IBAD) of yttria-stabilized zirconia (YSZ) on nickel alloy substrates is presented. Defect structures can originate anywhere in the coated conductor architecture. Defects can be additive and propagate through the entire film structure to affect the growth, orientation, arid properties of the superconducting film. Interfacial Ieactions between Y- 123 and the underlying buffer layer and the corresponding effects on the transport properticis of the films can be controlled with the thickness of the underlying buffer layer. With a 9Ow ceria buffer layer on an IBAD YSZ coated metal substrate, a J, value of 1.7 MA/cm{sup 2} (self-field, 75K) was obtained in a 1.5{micro}m thick Y-123 film.
- Research Organization:
- Los Alamos National Laboratory
- Sponsoring Organization:
- DOE
- OSTI ID:
- 975815
- Report Number(s):
- LA-UR-01-5680
- Country of Publication:
- United States
- Language:
- English
Similar Records
Microstructural Development in YBA2CU3O7 Coated Conductors Based on Ex Situ YBCO Conversion Processes
Fabrication of High Current YBa2Cu3O(sub>7-y) Coated Conductors Using Rolling-Assisted Biaxially Textured Substrates