ELLIPSOMETRY IN THE STUDY OF DYNAMIC MATERIAL PROPERTIES

Conference · Mon Jan 01 04:00:00 EST 2001

DOI:https://doi.org/10.1063/1.1483765· OSTI ID:975589

Obst, A W ^[1]; Alrick, K R ^[2]; Boboridis, K; Buttler, William T; Lamoreaux, Steve Keith; Montgomery, S L ^[3]; Payton, J R ^[4]; Wilke, M D ^[5]

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1. Andrew W.
2. Keith R.
3. Stefanie L.
4. Jeremy R.
5. Mark D.

Measurements of the time-dependent absolute temperature of surfaces shocked using high explosives (HE) provide valuable constraints on the equations-of-state (EOS) of materials and on the state of ejecta from those surfaces. In support of these dynamic surface temperature measurements, techniques for measuring the dynamic surface emissivity of shocked metals in the near infrared (IR) are being developed. These consist of time-dependent laser ellipsometric measurements, using several approaches. A discussion of these ellipsometric techniques is included here. Ellipsometry permits an accurate determination of the dynamic emissivity at a given wavelength, and may also provide a signature of melt in shocked metals.

• Research Organization: Los Alamos National Laboratory
• Sponsoring Organization: DOE
• OSTI ID: 975589
• Report Number(s): LA-UR-01-3483
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHEMICAL EXPLOSIVES
ELLIPSOMETRY
EMISSIVITY
EQUATIONS OF STATE
LASERS
SHOCK WAVES
TEMPERATURE MEASUREMENT