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Title: High Quality Single Shot Diffraction Patterns Using Ultrashort Megaelectron Volt Electron Beams from a Radio Frequency Photoinjector

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3292683· OSTI ID:973696

Single shot diffraction patterns using a 250 fs long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the RF photoinjector off a 100 nm thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction

Research Organization:
National Security Technologies, LLC (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NA)
DOE Contract Number:
DE-AC52-06NA25946
OSTI ID:
973696
Report Number(s):
DOE/NV/25946-824; RSINAK; TRN: US201007%%936
Journal Information:
Review of Scientific Instruments, Vol. 81, Issue 1; ISSN 0034-6748
Country of Publication:
United States
Language:
English