High Quality Single Shot Diffraction Patterns Using Ultrashort Megaelectron Volt Electron Beams from a Radio Frequency Photoinjector

Journal Article · Fri Jan 01 04:00:00 EST 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3292683· OSTI ID:973696

Single shot diffraction patterns using a 250 fs long electron beam have been obtained at the UCLA Pegasus laboratory. High quality images with spatial resolution sufficient to distinguish closely spaced peaks in the Debye-Scherrer ring pattern have been recorded by scattering the 1.6 pC 3.5 MeV electron beam generated in the RF photoinjector off a 100 nm thick Au foil. Dark current and high emittance particles are removed from the beam before sending it onto the diffraction target using a 1 mm diameter collimating hole. These results open the door to the study of irreversible phase transformations by single shot MeV electron diffraction

• Research Organization: National Security Technologies, LLC (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NA)
• DOE Contract Number: AC52-06NA25946
• OSTI ID: 973696
• Report Number(s): DOE/NV/25946--824
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 1 Vol. 81; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DIFFRACTION
ELECTRON BEAMS
ELECTRON DIFFRACTION
Electron diffraction and scattering
Photoconduction and photovoltaic effects
Electron and positron beams
megavolt electron diffraction
radio frequency photoinjector
PHASE TRANSFORMATIONS
SCATTERING
SPATIAL RESOLUTION
TARGETS
UCLA