Electro-optic sampling for time resolving relativistic ultrafast electron diffraction

Journal Article · Thu Jan 22 04:00:00 EST 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3080985· OSTI ID:21255296

Scoby, C M; Musumeci, P; Moody, J; Gutierrez, M; Tran, T ^[1]

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1. Department of Physics and Astronomy, University of California at Los Angeles, CA 90095-1547 (United States)

The Pegasus laboratory at UCLA features a state-of-the-art electron photoinjector capable of producing ultrashort (<100 fs) high-brightness electron bunches at energies of 3.75 MeV. These beams recently have been used to produce static diffraction patterns from scattering off thin metal foils, and it is foreseen to take advantage of the ultrashort nature of these bunches in future pump-probe time-resolved diffraction studies. In this paper, single shot 2-d electro-optic sampling is presented as a potential technique for time of arrival stamping of electron bunches used for diffraction. Effects of relatively low bunch charge (a few 10's of pC) and modestly relativistic beams are discussed and background compensation techniques to obtain high signal-to-noise ratio are explored. From these preliminary tests, electro-optic sampling is suitable to be a reliable nondestructive time stamping method for relativistic ultrafast electron diffraction at the Pegasus lab.

• OSTI ID: 21255296
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1086; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRON DIFFRACTION
ELECTRONS
MEV RANGE 01-10
RELATIVISTIC RANGE
SAMPLING
SIGNAL-TO-NOISE RATIO
SYNCHROTRON RADIATION
TIME RESOLUTION
UCLA