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Title: Electro-optic sampling for time resolving relativistic ultrafast electron diffraction

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3080985· OSTI ID:21255296
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  1. Department of Physics and Astronomy, University of California at Los Angeles, CA 90095-1547 (United States)

The Pegasus laboratory at UCLA features a state-of-the-art electron photoinjector capable of producing ultrashort (<100 fs) high-brightness electron bunches at energies of 3.75 MeV. These beams recently have been used to produce static diffraction patterns from scattering off thin metal foils, and it is foreseen to take advantage of the ultrashort nature of these bunches in future pump-probe time-resolved diffraction studies. In this paper, single shot 2-d electro-optic sampling is presented as a potential technique for time of arrival stamping of electron bunches used for diffraction. Effects of relatively low bunch charge (a few 10's of pC) and modestly relativistic beams are discussed and background compensation techniques to obtain high signal-to-noise ratio are explored. From these preliminary tests, electro-optic sampling is suitable to be a reliable nondestructive time stamping method for relativistic ultrafast electron diffraction at the Pegasus lab.

OSTI ID:
21255296
Journal Information:
AIP Conference Proceedings, Vol. 1086, Issue 1; Conference: 13. advanced accelerator concepts workshop, Santa Cruz, CA (United States), 27 Jul - 2 Aug 2008; Other Information: DOI: 10.1063/1.3080985; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English