Enhanced flux pinning in MOCVD-YBCO films through Zr additions : systematic feasibility studies.
Systematic effects of Zr additions on the structural and flux pinning properties of YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) films deposited by metal-organic chemical vapor deposition (MOCVD) have been investigated. Detailed characterization, conducted by coordinated transport, x-ray diffraction, scanning and transmission electron microscopy analyses, and imaging Raman microscopy have revealed trends in the resulting property/performance correlations of these films with respect to varying mole percentages (mol%) of added Zr. For compositions {le} 7.5 mol%, Zr additions lead to improved in-field critical current density, as well as extra correlated pinning along the c-axis direction of the YBCO films via the formation of columnar, self-assembled stacks of BaZrO{sub 3} nanodots.
- Research Organization:
- Argonne National Laboratory (ANL)
- Sponsoring Organization:
- EE
- DOE Contract Number:
- AC02-06CH11357
- OSTI ID:
- 972190
- Report Number(s):
- ANL/CSE/JA-65712
- Journal Information:
- Supercond. Sci. Technol., Journal Name: Supercond. Sci. Technol. Journal Issue: Jan. 2010 Vol. 23; ISSN SUSTEF; ISSN 0953-2048
- Country of Publication:
- United States
- Language:
- ENGLISH
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