Improved Performance of a Commercial SDD for X-ray Microanalysis
Conference
·
OSTI ID:962617
- ORNL
The performance of a silicon drift detector (SDD) is evaluated for SEM-based x-ray microanalysis. The throughput, spectral fidelity and energy resolution are measured as a function of input count rate and detector time constant for two pulse processors. Post-acquisition processing to minimize the effects of pulse pile-up is discussed.
- Research Organization:
- Oak Ridge National Laboratory (ORNL); Shared Research Equipment Collaborative Research Center
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 962617
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ENERGY RESOLUTION
MICROANALYSIS
PERFORMANCE
SCANNING ELECTRON MICROSCOPY
SI SEMICONDUCTOR DETECTORS
X-RAY DETECTION
energy resolution
pulse pile-up
pulse processor
silicon drift detector
x-ray microanalysis
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ENERGY RESOLUTION
MICROANALYSIS
PERFORMANCE
SCANNING ELECTRON MICROSCOPY
SI SEMICONDUCTOR DETECTORS
X-RAY DETECTION
energy resolution
pulse pile-up
pulse processor
silicon drift detector
x-ray microanalysis