Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis
Conference
·
OSTI ID:935734
- ORNL
Silicon drift detectors (SDDs) are rapidly becoming the energy dispersive spectrometer of choice especially for scanning electron microscopy applications. The complementary features of large active areas (i.e., collection angle) and high count rate capability of these detector contribute to their popularity, as well as the absence of liquid nitrogen cooling of the detector. The performance of an EDAX Apollo 40 SDD on a JEOL 6500F SEM will be discussed.
- Research Organization:
- Oak Ridge National Laboratory (ORNL); Shared Research Equipment Collaborative Research Center
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 935734
- Country of Publication:
- United States
- Language:
- English
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