Low-Angle Grain Boundaries in YBa₂Cu₃O_7-δ with High Critical Current Densities

Journal Article · Thu Jan 01 04:00:00 EST 2009 · Physical Review B

DOI:https://doi.org/10.1103/PhysRevB.79.014515· OSTI ID:959437

Held, R. ^[1]; Schneider, C. W. ^[1]; Mannhart, J. ^[1]; Allard, Jr, Lawrence Frederick ^[2]; More, Karren Leslie ^[2]; Goyal, Amit ^[2]

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1. Institute of Physics, Augsburg University, Augsburg, Germany
2. ORNL

The grain boundary network in high-T_c coated conductors consists of a large number of low angle grain boundaries with many types of misorientation. Using the bicrystal technique we have measured the critical current densities of the relevant YBa₂Cu₃O_7- grain boundary misorientations as a function of grain boundary angle. We find that in the low angle regime [010]-tilt boundaries and [100]-twist boundaries reduce the critical current density much less than [001]-tilt boundaries. Transmission electron microscopy reveals a low defect density in these boundaries and we find that CuO₂ planes cross these boundaries without interruption.

• Research Organization: Oak Ridge National Laboratory (ORNL); Shared Research Equipment Collaborative Research Center
• Sponsoring Organization: OE USDOE - Office of Electric Transmission and Distribution
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 959437
• Journal Information: Physical Review B, Journal Name: Physical Review B Journal Issue: 1 Vol. 79; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BICRYSTALS
CRITICAL CURRENT
DEFECTS
GRAIN BOUNDARIES
TRANSMISSION ELECTRON MICROSCOPY