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Orientation dependence of grain-boundary critical currents in YBa/sub 2/Cu/sub 3/O/sub 7-//sub delta/ bicrystals

Journal Article · · Phys. Rev. Lett.; (United States)
The critical current densities across grain boundaries have been measured as a function of misorientation angle in the basal plane with use of bicrystals of YBa/sub 2/Cu/sub 3/O/sub 7-//sub delta/. For small misorientation angles, the ratio of the grain-boundary critical current density to the bulk critical current density is roughly porportional to the inverse of the misorientation angle; for large angles, this ratio saturates to a value of about (1/50. These results imply that achieving a high degree of texture both normal to and within the basal plane is important for obtaining very high critical currents in pure polycrystalline samples.
Research Organization:
IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, New York 10598
OSTI ID:
7161115
Journal Information:
Phys. Rev. Lett.; (United States), Journal Name: Phys. Rev. Lett.; (United States) Vol. 61:2; ISSN PRLTA
Country of Publication:
United States
Language:
English