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U.S. Department of Energy
Office of Scientific and Technical Information

Enhanced Edot X System

Technical Report ·
DOI:https://doi.org/10.2172/957048· OSTI ID:957048
 [1];
  1. Institute for Security Studies, UNLV
The capability of EdotX would be improved by increasing the instrument's dynamic range to expand the range of signals measurable by the device. The heart of the EdotX system is a two channel analog to digital (A/D) conversion card with two analog to digital converters tightly coupled to a field programmable gate array (FPGA). Signals are continually digitized by the A/D and processed by the FPGA. When the FPGA detects a trigger condition, the data are transferred using direct memory access to the host computer memory, which in turn saves the data to disk. The original design utilizes a single A/D channel for data acquisition. The task was to increase the dynamic range of the system by enabling the second A/D channel, allowing the simultaneous acquisition of the original A/D channel and the additional second A/D channel. The input signal would be fed to the original channel and to the second channel with the second channel input being attenuated. When a signal hits the maximum range of the first channel, the data from the second channel, which is attenuated, are then used. Because both A/D's acquire data simultaneously, they may be used as a single expanded dynamic range channel.
Research Organization:
UNLV Research Foundation, 8311 W. Sunset Road, Suite 200, Las Vegas, NV 89113
Sponsoring Organization:
USDOE National Nuclear Security Administration (NA)
DOE Contract Number:
FG52-06NA27513
OSTI ID:
957048
Report Number(s):
DOE/NA/27513-F
Country of Publication:
United States
Language:
English