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Photoconducting ultraviolet detectors based on GaN films grown by electron cyclotron resonance molecular beam epitaxy

Conference ·
DOI:https://doi.org/10.1117/12.211915· OSTI ID:95356
;  [1]; ; ;  [2]
  1. Radiation Monitoring Devices, Inc., Watertown, MA (United States)
  2. Boston Univ., MA (United States). Molecular Beam Epitaxy Lab.
We report for the first time, fabrication of photoconducting UV detectors made from GaN films grown by molecular beam epitaxy. Semi-instilating GaN films were grown by the method of electron cyclotron resonance microwave plasma-assisted molecular beam epitaxy (ECR-MBE). Photoconductive devices with interdigitated electrodes were fabricated and their photoconducting properties were investigated. In this paper we report on the performance of the detectors in terms of UV responsivity, gain-quantum efficiency product, spectral response and response time. We have measured responsivity of 125A/W and gain-quantum efficiency product of 600 at 254nm and 25V. The response time was measured to be on the order of 20ns for our detectors, corresponding to a bandwidth of 25Mhz. The spectral response showed a sharp long-wavelength cutoff at 365nm, and remained constant in the 200nm to 365nm range. The response of the detectors to low-energy x-rays was measured and found to be linear for x-rays with energies ranging from 60kVp to 90kVp.
Research Organization:
Radiation Monitoring Devices, Inc., Watertown, MA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
FG02-94ER81843
OSTI ID:
95356
Report Number(s):
CONF-950793--7; ON: DE95015149
Country of Publication:
United States
Language:
English