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Title: Synthesis And Strain Relaxation of Ge-Core/Si-Shell Nanowire Arrays

Journal Article · · Nano Lett. 8:4081,2008
OSTI ID:953163

Analogous to planar heteroepitaxy, misfit dislocation formation and stress-driven surface roughening can relax coherency strains in misfitting core-shell nanowires. The effects of coaxial dimensions on strain relaxation in aligned arrays of Ge-core/Si-shell nanowires are analyzed quantitatively by transmission electron microscopy and synchrotron X-ray diffraction. Relating these results to reported continuum elasticity models for coaxial nanowire heterostructures provides valuable insights into the observed interplay of roughening and dislocation-mediated strain relaxation.

Research Organization:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-76SF00515
OSTI ID:
953163
Report Number(s):
SLAC-REPRINT-2009-121; TRN: US0902678
Journal Information:
Nano Lett. 8:4081,2008, Vol. 8, Issue 11
Country of Publication:
United States
Language:
English