Effect of CeO{sub 2} buffer layer thickness on the structures and properties of YBCO coated conductors.

Journal Article · Mon Jan 01 04:00:00 EST 2007 · Appl. Surf. Sci.

DOI:https://doi.org/10.1016/j.apsusc.2007.02.186· OSTI ID:952939

Li, M; Zhao, X; Ma, B; Dorris, S E; Balachandran, U; Maroni, V A

Biaxially textured YBa{sub 2}Cu{sub 3}O{sub 7-x} (YBCO) films were grown on inclined-substrate-deposited (ISD) MgO-textured metal substrates by pulsed laser deposition. CeO{sub 2} was deposited as a buffer layer prior to YBCO growth. CeO{sub 2} layers of different thickness were prepared to evaluate the thickness dependence of the YBCO films. The biaxial alignment features of the films were examined by X-ray diffraction 2{theta}-scans, pole-figure, {phi}-scans and rocking curves of {Omega} angles. The significant influence of the CeO{sub 2} thickness on the structure and properties of the YBCO films were demonstrated and the optimal thickness was found to be about 10 nm. High values of T{sub c} = 91 K and J{sub c} = 5.5 x 10{sup 5} A/cm{sup 2} were obtained on YBCO films with optimal CeO{sub 2} thickness at 77 K in zero field. The possible mechanisms responsible for the dependence of the structure and the properties of the YBCO films on the thickness of the CeO{sub 2} buffer layers are discussed.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: Scientific Research Foundation for the Returned Overseas Chinese Scholars
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 952939
• Report Number(s): ANL/ES/JA-64329
• Journal Information: Appl. Surf. Sci., Journal Name: Appl. Surf. Sci. Journal Issue: 2007 Vol. 253; ISSN ASUSEE; ISSN 0169-4332
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
BUFFERS
CERIUM OXIDES
COATINGS
COPPER OXIDES
DEPOSITION
FILMS
MORPHOLOGY
THICKNESS
TRANSITION TEMPERATURE
YTTRIUM OXIDES