Interfacial thermal resistance in nanocrystalline yttria-stabilized zirconia.

Journal Article · Sat Jun 01 04:00:00 EDT 2002 · Acta Materialia

DOI:https://doi.org/10.1016/S1359-6454(02)00057-5· OSTI ID:949457

Yang, H -S; Bai, G -R; Thompson, L J; Eastman, J A

The grain-size dependent thermal conductivity of nanocrystalline yttria-stabilized zirconia from 6-480K is reported. The thermal conductivity for a grain size of 10 nm is reduced to approximately half that of coarse-grained or single-crystal material at all measured temperatures. A method for determining the interfacial resistance to thermal transport in polycrystalline materials from measurements of grain-size-dependent thermal conductivity is described and applied. The results suggest a new strategy for identifying improved thermal barrier materials by choosing materials with large interfacial thermal resistance and reduced dimensionality or grain size, rather than by focusing on minimization of bulk thermal conductivity alone.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 949457
• Report Number(s): ANL/MSD/JA-41100
• Journal Information: Acta Materialia, Journal Name: Acta Materialia Journal Issue: 9 ; Jun. 2002 Vol. 50; ISSN 1359-6454; ISSN ACMAFD
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

12 MANAGEMENT OF RADIOACTIVE AND NON-RADIOACTIVE WASTES FROM NUCLEAR FACILITIES
FOCUSING
GRAIN SIZE
MINIMIZATION
THERMAL BARRIERS
THERMAL CONDUCTIVITY
TRANSPORT
ZIRCONIUM OXIDES