Grain-size-dependent thermal conductivity of nanocrystalline yttria-stabilized zirconia films grown by metal-organic chemical vapor deposition

Journal Article · Mon Aug 21 04:00:00 EDT 2000 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1289803· OSTI ID:20217312

Soyez, G ^[1]; Eastman, J A ^[1]; Thompson, L J ^[1]; Bai, G -R ^[1]; Baldo, P M ^[1]; McCormick, A W ^[1]; DiMelfi, R J ^[2]; Elmustafa, A A ^[3]; Tambwe, M F ^[3]; Stone, D S ^[3]

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1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. Reactor Engineering Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
3. Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706 (United States)

A grain-size-dependent reduction in the room-temperature thermal conductivity of nanocrystalline yttria-stabilized zirconia is reported for the first time. Films were grown by metal-organic chemical vapor deposition with controlled grain sizes from 10 to 100 nm. For grain sizes smaller than approximately 30 nm, a substantial reduction in thermal conductivity was observed, reaching a value of less than one-third the bulk value at the smallest grain sizes measured. The observed behavior is consistent with expectations based on an estimation of the phonon mean-free path in zirconia.(c) 2000 American Institute of Physics.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• OSTI ID: 20217312
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 8 Vol. 77; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHEMICAL VAPOR DEPOSITION
EXPERIMENTAL DATA
GRAIN SIZE
THERMAL CONDUCTIVITY
THIN FILMS
YTTRIUM OXIDES
ZIRCONIUM OXIDES