Advanced, non-destructive defect localization in microelectronics.
Conference
·
OSTI ID:946271
No abstract prepared.
- Research Organization:
- Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 946271
- Report Number(s):
- SAND2007-7751C; TRN: US200903%%281
- Resource Relation:
- Conference: Proposed for presentation at the MRQW (Microelectronic Reliability and Quality Workshop) held December 4-5, 2007 in Manhattan Beach, CA.
- Country of Publication:
- United States
- Language:
- English
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