Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis

Conference · Tue Jan 01 00:00:00 EST 2008

OSTI ID:935734

Kenik, Edward A ^[1]

---

1. ORNL

Silicon drift detectors (SDDs) are rapidly becoming the energy dispersive spectrometer of choice especially for scanning electron microscopy applications. The complementary features of large active areas (i.e., collection angle) and high count rate capability of these detector contribute to their popularity, as well as the absence of liquid nitrogen cooling of the detector. The performance of an EDAX Apollo 40 SDD on a JEOL 6500F SEM will be discussed.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Shared Research Equipment Collaborative Research Center
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 935734
• Resource Relation: Conference: Microscopy and Microanalysis 2008, Albuquerque, NM, USA, 20080803, 20080807
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MICROANALYSIS
DRIFT CHAMBERS
SILICON
PERFORMANCE
SCANNING ELECTRON MICROSCOPY
X-RAY SPECTROMETERS
silicon drift detector
x-ray microanalysis
fast elemental mapping
pulse pileup