Measuring grain boundary segregation in nanocrystalline alloys: Direct validation of statistical techniques using atom probe tomography

Journal Article · Mon Jan 01 00:00:00 EST 2007 · Philosophical Magazine Letters

DOI:https://doi.org/10.1080/09500830701400125· OSTI ID:931760

Detor, Andrew J. ^[1]; Miller, Michael K ^[2]; Schuh, Christopher A. ^[1]

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1. Massachusetts Institute of Technology (MIT)
2. ORNL

Atom probe tomography (APT) is used to investigate grain-boundary segregation of W solute atoms in nanocrystalline Ni. For the heat-treated specimens used here, the grain structure can be observed in the APT data, enabling direct composition analyses across individual grain boundaries. These direct measurements are used to validate methods proposed in earlier work, which determine the average segregation state in nanocrystalline materials through statistical analysis of the solute distribution, without knowledge of the boundary positions. Good agreement is demonstrated between the two experimental techniques.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Shared Research Equipment Collaborative Research Center
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 931760
• Journal Information: Philosophical Magazine Letters, Vol. 87, Issue 8; ISSN 0950-0839
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
NANOSTRUCTURES
ALLOYS
GRAIN BOUNDARIES
SEGREGATION
TOMOGRAPHY
VALIDATION
NICKEL
TUNGSTEN