Solute distribution in nanocrystalline Ni-W alloys examined through atom probe tomography

Journal Article · Sun Jan 01 00:00:00 EST 2006 · Philosophical Magazine

DOI:https://doi.org/10.1080/14786430600726749· OSTI ID:1003245

Detor, Andrew J. ^[1]; Miller, Michael K ^[2]; Schuh, Christopher A. ^[1]

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1. Massachusetts Institute of Technology (MIT)
2. ORNL

Atom probe tomography is used to observe the solute distribution in electrodeposited nanocrystalline Ni-W alloys with three different grain sizes (3, 10 and 20 nm) and the results are compared with atomistic computer simulations. The presence of grain boundary segregation is confirmed by detailed analysis of composition fluctuations in both experimental and simulated structures, and its extent quantified by a frequency distribution analysis. In contrast to other nanocrystalline alloys previously examined by atom probe tomography, such as Ni-P, the present nanocrystalline Ni-W alloys exhibit only a subtle amount of solute segregation to the intergranular regions.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Shared Research Equipment Collaborative Research Center
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1003245
• Journal Information: Philosophical Magazine, Vol. 86, Issue 28; ISSN 1478--6435
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
ALLOYS
ATOMS
COMPUTERIZED SIMULATION
DISTRIBUTION
FLUCTUATIONS
GRAIN SIZE
NICKEL ALLOYS
SEGREGATION
SOLUTES
TOMOGRAPHY
TUNGSTEN ALLOYS