Application of Glancing-Emergent-Angle Fluorescence for Polarized XAFS Studies of Single Crystals
Journal Article
·
· Journal of Synchrotron Radiation
X-ray absorption fine-structure (XAFS) data were obtained for the V K-edge for a series of anisotropic single crystals of (Cr{sub x}V{sub 1-x}){sub 2}O{sub 3}. The data and the results were compared for the as-prepared bulk single crystals (measured in fluorescence in two different orientations) and those ground to powder (measured in transmission). For the bulk single crystals, the glancing-emergent-angle (GEA) method was used to minimize fluorescence distortion. The reliability of the GEA technique was tested by comparing the polarization-weighted single-crystal XAFS data with the experimental powder data. These data were found to be in excellent agreement throughout the entire energy range. Thus, it was possible to reliably measure individual V-V contributions parallel and perpendicular to the c axis of the single crystals, i.e. those unavailable by powder data XAFS analysis. These experiments demonstrate that GEA is a premiere method for non-destructive high-photon-count in situ studies of local structure in bulk single crystals.
- Research Organization:
- Brookhaven National Laboratory (BNL) National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 930445
- Report Number(s):
- BNL--81197-2008-JA
- Journal Information:
- Journal of Synchrotron Radiation, Journal Name: Journal of Synchrotron Radiation Vol. 14; ISSN 0909-0495; ISSN JSYRES
- Country of Publication:
- United States
- Language:
- English
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