Nanoscale Observation of Delayering in Alkane Films
Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane (n-C{sub 32}H{sub 66} or C32) films adsorbed on SiO{sub 2}-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point T{sub b} in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above T{sub b} and to a solid 3D phase on cooling below T{sub b}. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.
- Research Organization:
- Brookhaven National Laboratory (BNL) National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 929963
- Report Number(s):
- BNL--80567-2008-JA
- Journal Information:
- Europhysics Letters, Journal Name: Europhysics Letters Vol. 79; ISSN 0295-5075; ISSN EULEEJ
- Country of Publication:
- United States
- Language:
- English
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