Atomic force microscopy study of the growth and annealing of Geislands on Si(100)
Journal Article
·
· The Journal of Vacuum Science and Technology B
OSTI ID:928322
No abstract prepared.
- Research Organization:
- COLLABORATION - U.Colorado
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 928322
- Report Number(s):
- LBNL--52081; BnR: KC0301020
- Journal Information:
- The Journal of Vacuum Science and Technology B, Journal Name: The Journal of Vacuum Science and Technology B Journal Issue: 2 Vol. 20
- Country of Publication:
- United States
- Language:
- English
Similar Records
Atomic Force Microscopy Nanotribology Study of OligothiopheneSelf-Assembled Films
Micromachined atomic force microscopy sensor with intergratedpiezoresistive sensor and thermal bimorph actuator for high-speedtapping-mode atomic force microscopy phase-imaging in highereigenmodes
The Analysis of Genomes by Atomic Force Microscopy
Journal Article
·
Wed Sep 28 00:00:00 EDT 2005
· Nanotechnology
·
OSTI ID:883777
Micromachined atomic force microscopy sensor with intergratedpiezoresistive sensor and thermal bimorph actuator for high-speedtapping-mode atomic force microscopy phase-imaging in highereigenmodes
Journal Article
·
Mon Mar 31 23:00:00 EST 2003
· Journal of Vacuum Science Thechnology B
·
OSTI ID:928700
The Analysis of Genomes by Atomic Force Microscopy
Journal Article
·
Tue Dec 31 23:00:00 EST 1996
· Scanning Microscopy
·
OSTI ID:814833