Quantitative characterization of the contrast mechanisms of ultra-small angle x-ray scattering imaging.

Journal Article · Tue Apr 01 04:00:00 EDT 2008 · Acta Crystallogr. A

DOI:https://doi.org/10.1107/S0021889808000733· OSTI ID:927736

Zhang, F; Long, G G; Levine, L E; Ilavsky, J; Jemain, P R; NIST,

A general treatment of X-ray imaging contrast for ultra-small-angle X-ray scattering (USAXS) imaging is presented; this approach makes use of phase propagation and dynamical diffraction theory to account quantitatively for the intensity distribution at the detector plane. Simulated results from a model system of micrometer-sized spherical SiO{sub 2} particles embedded in a polypropylene matrix show good agreement with experimental measurements. Simulations by means of a separate geometrical ray-tracing method also account for the features in the USAXS images and offer a complementary view of small-angle X-ray scattering as a contrast mechanism. The ray-tracing analysis indicates that refraction, in the form of Porod scattering, and, to a much lesser extent, X-ray reflection account for the USAXS imaging contrast.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 927736
• Report Number(s): ANL/XSD/JA-59911
• Journal Information: Acta Crystallogr. A, Journal Name: Acta Crystallogr. A Journal Issue: Apr. 2008 Vol. 41; ISSN JACGAR; ISSN 0021-8898
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
ENCAPSULATION
IMAGES
POLYPROPYLENE
REFLECTION
REFRACTION
SILICON OXIDES
SMALL ANGLE SCATTERING
X-RAY DIFFRACTION