Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

In-situ synchrotron measurements of oxide growth strains.

Conference ·
OSTI ID:925168

No abstract prepared.

Research Organization:
Argonne National Laboratory (ANL)
Sponsoring Organization:
SC
DOE Contract Number:
AC02-06CH11357
OSTI ID:
925168
Report Number(s):
ANL/XFD/CP-50463
Country of Publication:
United States
Language:
ENGLISH

Similar Records

Direct synchrotron x-ray microdiffraction measurements of strain and bending in micromachined silicon devices.
Conference · Wed Dec 31 23:00:00 EST 2003 · OSTI ID:925188

Strain Measurements Using Synchrotron Micro-Laue Diffraction
Conference · Wed Oct 10 00:00:00 EDT 2007 · OSTI ID:1009023

"In-situ" far infrared spectroscopy of electrode surfaces with a synchrotron source.
Conference · Sun Dec 31 23:00:00 EST 1995 · OSTI ID:938009