Surface Roughness Characterization of Niobium Subjected to Incremental BCP and EP Processing Steps
Conference
·
OSTI ID:923389
The surface of niobium samples polished under incremental Buffered Chemical Polish (BCP) and Electro-Polishing (EP) have been characterized through Atomic Force Microscopy (AFM) and stylus profilometry across a range of length of scales. The results were analyzed using Power Density Spectral (PSD) technique to determine roughness and characteristic dimensions. This study has shown that the PSD method is a valuable tool that provides quantitative information about surface roughness at different length scales.
- Research Organization:
- Thomas Jefferson National Accelerator Facility, Newport News, VA
- Sponsoring Organization:
- USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-06OR23177
- OSTI ID:
- 923389
- Report Number(s):
- JLAB-ACC-07-793; DOE/OR/23177-0314
- Country of Publication:
- United States
- Language:
- English
Similar Records
Characterization of scale-dependent roughness of niobium surfaces as a function of surface treatment processes
ROUGHNESS ANALYSIS OF VARIOUSLY POLISHED NIOBIUM SURFACES
Integrated Surface Topography Characterization of Variously Polished Niobium for Superconducting Particle Accelerators
Conference
·
Fri Jun 01 00:00:00 EDT 2012
·
OSTI ID:1994843
ROUGHNESS ANALYSIS OF VARIOUSLY POLISHED NIOBIUM SURFACES
Journal Article
·
Mon Dec 31 23:00:00 EST 2007
· Journal of Undergraduate Research
·
OSTI ID:1052102
Integrated Surface Topography Characterization of Variously Polished Niobium for Superconducting Particle Accelerators
Conference
·
Fri May 01 00:00:00 EDT 2009
·
OSTI ID:1021840