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Integrated Surface Topography Characterization of Variously Polished Niobium for Superconducting Particle Accelerators

Conference ·
OSTI ID:1021840
As superconducting niobium radio-frequency (SRF) cavities approach fundamental material limits, there is increased interest in understanding the details of topographical influences on realized performance limitations. Micro-and nano-roughness are implicated in both direct geometrical field enhancements as well as complications of the composition of the 50 nm surface layer in which the super-currents flow. Interior surface chemical polishing (BCP/EP) to remove mechanical damage leaves surface topography, including pits and protrusions of varying sharpness. These may promote RF magnetic field entry, locally quenching superconductivity, so as to degrade cavity performance. A more incisive analysis of surface topography than the widely-used average roughness is needed. In this study, a power spectral density (PSD) approach based on Fourier analysis of surface topography data acquired by both stylus profilometry and atomic force microscopy (AFM) is being used to distinguish the scale-dependent smoothing effects. The topographical evolution of the Nb surface as a function of different steps of EP is reported, resulting in a novel qualitative and quantitative description of Nb surface topography.
Research Organization:
Thomas Jefferson National Accelerator Facility, Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
AC05-06OR23177
OSTI ID:
1021840
Report Number(s):
JLAB-ACC-09-979; DOE/OR/23177-0732
Country of Publication:
United States
Language:
English

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