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Title: Scanning polarization force microscopy: A technique for studies ofwetting Phenomena at the Nanometer Scale

Abstract

We describe a technique developed recently based on the use of electrostatic forces in the atomic force microscope (AFM) to image liquid films and droplets. The technique, named scanning polarization force microscopy (SPFM), is a truly non-contact technique where the tip scans the surface at a height of a few hundred angstroms, which is sufficient to minimize perturbation of the liquid film. The resolution of the technique is a few hundred angstroms horizontally and one angstrom vertically. The information provided by SPFM includes topography, contact potential, and dielectric (frequency dependent) mapping. After a brief introduction to basic wetting concepts, we describe the technique and illustrate with several examples its potential applications.

Authors:
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Director. Office of Science. Basic EnergySciences
OSTI Identifier:
917031
Report Number(s):
LBNL-46822
R&D Project: 517950; BnR: KC0203010; TRN: US200816%%237
DOE Contract Number:  
DE-AC02-05CH11231
Resource Type:
Journal Article
Journal Name:
Oil and Gas Science and Technology
Additional Journal Information:
Journal Volume: 56; Journal Issue: 1; Related Information: Journal Publication Date: 2001
Country of Publication:
United States
Language:
English
Subject:
36; ELECTROSTATICS; MICROSCOPES; MICROSCOPY; POLARIZATION; RESOLUTION; TOPOGRAPHY

Citation Formats

Salmeron, Miquel. Scanning polarization force microscopy: A technique for studies ofwetting Phenomena at the Nanometer Scale. United States: N. p., 2000. Web.
Salmeron, Miquel. Scanning polarization force microscopy: A technique for studies ofwetting Phenomena at the Nanometer Scale. United States.
Salmeron, Miquel. Fri . "Scanning polarization force microscopy: A technique for studies ofwetting Phenomena at the Nanometer Scale". United States.
@article{osti_917031,
title = {Scanning polarization force microscopy: A technique for studies ofwetting Phenomena at the Nanometer Scale},
author = {Salmeron, Miquel},
abstractNote = {We describe a technique developed recently based on the use of electrostatic forces in the atomic force microscope (AFM) to image liquid films and droplets. The technique, named scanning polarization force microscopy (SPFM), is a truly non-contact technique where the tip scans the surface at a height of a few hundred angstroms, which is sufficient to minimize perturbation of the liquid film. The resolution of the technique is a few hundred angstroms horizontally and one angstrom vertically. The information provided by SPFM includes topography, contact potential, and dielectric (frequency dependent) mapping. After a brief introduction to basic wetting concepts, we describe the technique and illustrate with several examples its potential applications.},
doi = {},
url = {https://www.osti.gov/biblio/917031}, journal = {Oil and Gas Science and Technology},
number = 1,
volume = 56,
place = {United States},
year = {2000},
month = {12}
}