Active sites on SiO{sub 2}. Role in CH{sub 3}OH decomposition
- Univ. of Pittsburgh, PA (United States)
The dehydroxylation of SiO{sub 2} and adsorption and thermal decomposition of CH{sub 3}OH on dehydroxylated SiO{sub 2} prepared at extreme temperatures up to 1475 K has been studied using transmission infrared spectroscopy. Formation of Si-O Si linkages (as evidenced by 888 and 908 cm{sup -1} bands) is directly related to the loss of the isolated SiO-H band at 3748 cm{sup -1} during SiO{sub 2} dehydroxylation to produce H{sub 2}O{sub 1}. High-resolution (0.75 cm{sup -1}) studies of the isolated SiO-H band show sharpening and a slight 4 cm{sup -1} shift to higher frequency with decreasing -OH coverage and may be explained by site inhomogeneity effects. Adsorption of CH{sub 3}OH on dehydroxylated SiO{sub 2} occurs first by reaction with SiOSi sites, followed by exchange with SiOH groups at elevated temperatures leading to SiOCH{sub 3} surfaces species. CH{sub 3}{sup 18}OH adsorption studies demonstrated that adsorption on SiOSi sites occurs by cleavage of the methanol O-H bond forming SiOH and Si{sup 18}OCH{sub 3}. Thermal decomposition of SiOCH{sub 3} groups creates SiH{sub x} (x = 1,2) species and prevents formation of the SiOSi sites indicative of the production of free radical sites at the surface. At temperatures above 1300 K, SiH{sub x} decomposition leads to SiOSi site formation. 40 refs., 11 figs.
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 91253
- Journal Information:
- Langmuir, Journal Name: Langmuir Journal Issue: 7 Vol. 11; ISSN LANGD5; ISSN 0743-7463
- Country of Publication:
- United States
- Language:
- English
Similar Records
Matrix reactions of methylsilanes and oxygen atoms
Mass spectrometric study of high-temperature dehydroxylation of disperse silicas and the interpretation of their IR spectra in the region of Si-O stretching vibrations
Attenuated total reflectance study of silicon-rich silicon dioxide films
Journal Article
·
Wed Feb 10 23:00:00 EST 1988
· J. Phys. Chem.; (United States)
·
OSTI ID:5324527
Mass spectrometric study of high-temperature dehydroxylation of disperse silicas and the interpretation of their IR spectra in the region of Si-O stretching vibrations
Journal Article
·
Mon Jul 01 00:00:00 EDT 1985
· Theor. Exp. Chem. (Engl. Transl.); (United States)
·
OSTI ID:6090437
Attenuated total reflectance study of silicon-rich silicon dioxide films
Journal Article
·
Tue Jul 01 00:00:00 EDT 1980
· J. Appl. Phys.; (United States)
·
OSTI ID:5270670