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Title: Highly charged ion bases time-of-flight emission microscope

Abstract

No abstract prepared.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
COLLABORATION - LLNL
OSTI Identifier:
900689
Report Number(s):
LBNL-48842
Journal ID: ISSN 0034-6748; RSINAK; TRN: US200711%%232
DOE Contract Number:  
DE-AC02-05CH11231
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 71; Journal Issue: 5; Related Information: Journal Publication Date: 05/2000; Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; MICROSCOPES; DESIGN; TIME-OF-FLIGHT METHOD

Citation Formats

Hamza, A V, Barnes, A V, Magee, E, Newman, M, Schenkel, T, McDonald, J W, and Schneider, D. Highly charged ion bases time-of-flight emission microscope. United States: N. p., 1998. Web.
Hamza, A V, Barnes, A V, Magee, E, Newman, M, Schenkel, T, McDonald, J W, & Schneider, D. Highly charged ion bases time-of-flight emission microscope. United States.
Hamza, A V, Barnes, A V, Magee, E, Newman, M, Schenkel, T, McDonald, J W, and Schneider, D. Mon . "Highly charged ion bases time-of-flight emission microscope". United States.
@article{osti_900689,
title = {Highly charged ion bases time-of-flight emission microscope},
author = {Hamza, A V and Barnes, A V and Magee, E and Newman, M and Schenkel, T and McDonald, J W and Schneider, D},
abstractNote = {No abstract prepared.},
doi = {},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 5,
volume = 71,
place = {United States},
year = {1998},
month = {8}
}