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Quantitative LEED analysis of the surface structure of a MgCl2thin film grown on Pd(111)

Journal Article · · Surface Science
OSTI ID:899780
An epitaxial, ultrathin single-crystal film (12 Angstrom) of MgCl[2] was deposited molecularly onto a Pd single crystal of (111) orientation at a crystal temperature of {approx}650 K. A detailed surface structure determination of this insulating film was performed by low-energy electron diffraction (LEED). A low incident LEED beam current (0.36 mu A) was employed to minimize the electron-stimulated desorption (ESD) of Cl. The best-fit model for the observed hexagonal MgCl[2](1 x 1) pattern corresponds to the unreconstructed (0001) Cl-terminated plane of alpha-MgCl[2], whose stacking sequence is Cl-Mg-Cl-Cl-Mg-Cl..., with a Pendry R-factor of 0.317. Small relaxations of the surface were found as 0.03 +- 0.03, 0,003 +-0.04 and 0.04 +- 0.08 Angstrom expansions of the first three Mg-Cl interlayer spacings, respectively, and a 0.10 +- 0.06 A contraction of the first Cl-Cl interlayer spacing. These small deviations were probably driven by the loss of the van der Waals interaction at the termination plane, since surface structure data for transition-metal dichalcogenides, which have different intralayer bonding, but the same intertrilayer bonding, report a similar magnitude of interlayer spacing deviations as seen in MgCl[2].
Research Organization:
Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
Sponsoring Organization:
USDOE Director, Office of Energy Research
DOE Contract Number:
AC02-05CH11231
OSTI ID:
899780
Report Number(s):
LBNL--40712
Journal Information:
Surface Science, Journal Name: Surface Science Journal Issue: 1 Vol. 399; ISSN SUSCAS; ISSN 0039-6028
Country of Publication:
United States
Language:
English

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