Surface structural analysis of LiF(100) thin films grown on Pt(111)

Journal Article · Thu Aug 29 04:00:00 EDT 2002 · Surface Science

DOI:https://doi.org/10.1016/S0039-6028(02)02091-5· OSTI ID:822618

Roberts, J G ^[1]; Van Hove, M A; Somorjai, G A

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1. LBNL Library

The surface structure of a multilayer LiF(100) thin film grown on Pt(111) from the vapor has been determined by the automated tensor low energy electron diffraction (LEED) method. The final structure, which refined to a Pendry R-factor (RP) of 0.24, had a surface corrugation (D1) of 0.24+-0.04 Angstrom due to the Li+ being displaced towards the bulk, leaving the initially coplanar F - unshifted. A similar intralayer corrugation due to the movement of the Li+ was also observed in the layer immediately under the surface layer, although to a lesser degree: D2=0.07+-0.04 Angstrom. This asymmetric relaxation resulted in the reduction of the first interlayer spacing, d(F2-Li1), to 1.77+-0.0 6 Angstrom from the ideal value of 2.01 Angstrom. The second interlayer spacing, d(Li3-F2), was within error bars of the bulk value, 2.01 Angstrom.

• Research Organization: Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
• Sponsoring Organization: USDOE Director. Office of Science. Basic Energy Sciences (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 822618
• Report Number(s): LBNL--50024
• Journal Information: Surface Science, Journal Name: Surface Science Vol. 518; ISSN SUSCAS; ISSN 0039-6028
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ELECTRON DIFFRACTION
RELAXATION
SURFACE STRUCTURE LIF LOW-ENERGY ELECTRON DIFFRACTION (LEED)
THIN FILMS