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Title: Lithographic characterization of the field dependent astigmatismand alignment stability of a 0.3 numerical aperture extreme ultravioletmicrofield optic

Journal Article · · The Journal of Vacuum Science and Technology B
DOI:https://doi.org/10.1116/1.2037647· OSTI ID:899737

No abstract prepared.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Director. Office of Science. Office of AdvancedScientific Computing Research. Office of Basic Energy Sciences,SEMATECH
DOE Contract Number:
DE-AC02-05CH11231
OSTI ID:
899737
Report Number(s):
LBNL-60355; R&D Project: M30007; BnR: 600303000; TRN: US200708%%512
Journal Information:
The Journal of Vacuum Science and Technology B, Vol. 23, Issue 5; Related Information: Journal Publication Date: Sep/Oct 2005
Country of Publication:
United States
Language:
English

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