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Analysis of copper-rich precipitates in silicon: Chemical state, gettering, and impact on multicrystalline silicon solar cell material

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.1827913· OSTI ID:898715

Synchrotron-based x-rayabsorption microspectroscopy (μ-XAS) is applied to identify the chemical states of copper-rich clusters within a variety of siliconmaterials, including as-grown cast multicrystalline silicon solar cell material with high oxygen concentration and other siliconmaterials with varying degrees of oxygen concentration and copper contamination pathways.

Research Organization:
Advanced Photon Source (APS), Argonne National Laboratory (ANL), Argonne, IL (US); Univ. of California at Berkeley; LBNL; Siliconsultant
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-06CH11357
OSTI ID:
898715
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 6 Vol. 97; ISSN JAPIAU; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English