Images of the antiferromagnetic structure of a NiO(100) surface bymeans of x-ray magnetic linear dichroism spectro-microscopy

Journal Article · Tue Jun 01 00:00:00 EDT 1999 · Physical Review Letters

OSTI ID:893723

Stohr, J; Scholl, A; Regan, T; Anders, S; Luning, J; Scheinfein, M R; Padmore, H A; White, R L

We present the first images of a surface showing clear antiferromagnetic contrast. The images were obtained for 10-80 nm thick NiO(100) films grown on Mg(100) by means of x-ray magnetic linear dichroism spectroscopy in conjunction with high resolution photoelectron emission microscopy. The surface sensitive images with a lateral resolution of better than 50 nm reveal surface line defects that exhibit antiferromagnetic order with a reduced Neel temperature (455 K) relative to the rest of the film surface and the bulk (523 K). Analysis of the temperature dependent images allows us to separate the spin and charge components of the linear dichroism effect.

• Research Organization: Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US); Advanced Light Source(ALS)
• Sponsoring Organization: USDOE Director, Office of Science. Office of Basic EnergySciences; 1999 IDEMA Fellowship
• DOE Contract Number: AC02-05CH11231
• OSTI ID: 893723
• Report Number(s): LBNL--43571; LBNL/ALS--28161
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 9 Vol. 83; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANTIFERROMAGNETISM
DICHROISM
IMAGES
LINE DEFECTS
NEEL TEMPERATURE
NICKEL OXIDES
advanced light source als