WHITE BEAM X-RAY MICRODIFFRACTIN ANALYSIS OF POLYCRYSTALLINE THIN FILMS
Journal Article
·
· BIOCHEMISTRY
OSTI ID:884607
No abstract prepared.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- DOE/OFFICE OF SCIENCE
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 884607
- Report Number(s):
- BNL-76324-2005-JA; TRN: US200615%%1059
- Journal Information:
- BIOCHEMISTRY, Vol. 41
- Country of Publication:
- United States
- Language:
- English
Similar Records
Synchrotron White Beam X-ray Topography, Transmission Electron Microscopy and High Resolution X-ray Diffraction Studies of Defects and Strain Relaxation Processes in Wide Bandgap Semiconductor Crystals and Thin Films
Scanning X-ray microdiffraction with submicrometer white beam for strain / stress and orientation mapping in thin films
DETERMINATION BY X-RAY REFLECTIVITY AND SMALL ANGLE X-RAY SCATTERING OF THE POROUS PROPERTIES OF MESOPOROUS SILICA THIN FILMS
Journal Article
·
Sun Jan 01 00:00:00 EST 2006
· Materials Science in Semiconductor Processing
·
OSTI ID:884607
+3 more
Scanning X-ray microdiffraction with submicrometer white beam for strain / stress and orientation mapping in thin films
Journal Article
·
Sat Mar 01 00:00:00 EST 2003
· Journal of Synchrotron Radiation
·
OSTI ID:884607
DETERMINATION BY X-RAY REFLECTIVITY AND SMALL ANGLE X-RAY SCATTERING OF THE POROUS PROPERTIES OF MESOPOROUS SILICA THIN FILMS
Journal Article
·
Sat Jan 01 00:00:00 EST 2005
· RADIOCHIM. ACTA
·
OSTI ID:884607
+4 more