Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

MEMS and ta-C thin films: overview of devices.

Conference ·
OSTI ID:876317
No abstract prepared.
Research Organization:
Sandia National Laboratories
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
876317
Report Number(s):
SAND2004-4427C
Country of Publication:
United States
Language:
English

Similar Records

Measuring stress gradients by etch-back in annealed (ta-C) thin films.
Conference · Wed Nov 30 23:00:00 EST 2005 · OSTI ID:886656

Overview of MEMS packaging requirements and processes.
Conference · Sun Oct 01 00:00:00 EDT 2006 · OSTI ID:897636

Shock testing of MEMS devices.
Conference · Tue Jun 01 00:00:00 EDT 2004 · OSTI ID:957206