Diffraction spectral filter for use in extreme-UV lithography condenser
Patent
·
OSTI ID:874831
- Albuquerque, NM
- Castro Valley, CA
- Livermore, CA
A condenser system for generating a beam of radiation includes a source of radiation light that generates a continuous spectrum of radiation light; a condenser comprising one or more first optical elements for collecting radiation from the source of radiation light and for generating a beam of radiation; and a diffractive spectral filter for separating first radiation light having a particular wavelength from the continuous spectrum of radiation light. Cooling devices can be employed to remove heat generated. The condenser system can be used with a ringfield camera in projection lithography.
- Research Organization:
- SANDIA CORP
- DOE Contract Number:
- AC04-94AL85000
- Assignee:
- EUV LLC (Santa Clara, CA)
- Patent Number(s):
- US 6469827
- OSTI ID:
- 874831
- Country of Publication:
- United States
- Language:
- English
EUV optical design for a 100-nm CD imaging system
|
conference | June 1998 |
New optics design methodology using diffraction grating on spherical mirrors for soft x-ray projection lithography
|
journal | March 1995 |
Electron-beam-deposited Mo/Si and MoxSiy/Si multilayer x-ray mirrors and gratings
|
journal | April 1994 |
Similar Records
Extreme-UV lithography condenser
Condenser for extreme-UV lithography with discharge source
Condenser for illuminating a ringfield camera with synchrotron emission light
Patent
·
Sun Dec 31 23:00:00 EST 2000
·
OSTI ID:873643
Condenser for extreme-UV lithography with discharge source
Patent
·
Sun Dec 31 23:00:00 EST 2000
·
OSTI ID:873974
Condenser for illuminating a ringfield camera with synchrotron emission light
Patent
·
Tue Apr 30 00:00:00 EDT 1996
·
OSTI ID:224984
Related Subjects
/359/355/378/
beam
camera
collecting
comprising
condenser
continuous
cooling
devices
diffraction
diffractive
elements
employed
extreme-uv
extreme-uv lithography
filter
generated
generates
generating
heat
light
lithography
optical
projection
radiation
remove
remove heat
ringfield
separating
source
spectral
spectrum
wavelength
beam
camera
collecting
comprising
condenser
continuous
cooling
devices
diffraction
diffractive
elements
employed
extreme-uv
extreme-uv lithography
filter
generated
generates
generating
heat
light
lithography
optical
projection
radiation
remove
remove heat
ringfield
separating
source
spectral
spectrum
wavelength