Constricted glow discharge plasma source
Patent
·
OSTI ID:873337
- Albany, CA
- San Leandro, CA
- Berkeley, CA
- Winnetka, IL
A constricted glow discharge chamber and method are disclosed. The polarity and geometry of the constricted glow discharge plasma source is set so that the contamination and energy of the ions discharged from the source are minimized. The several sources can be mounted in parallel and in series to provide a sustained ultra low source of ions in a plasma with contamination below practical detection limits. The source is suitable for applying films of nitrides such as gallium nitride and oxides such as tungsten oxide and for enriching other substances in material surfaces such as oxygen and water vapor, which are difficult process as plasma in any known devices and methods. The source can also be used to assist the deposition of films such as metal films by providing low-energy ions such as argon ions.
- Research Organization:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA
- DOE Contract Number:
- AC03-76SF00098
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Number(s):
- US 6137231
- OSTI ID:
- 873337
- Country of Publication:
- United States
- Language:
- English
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|
journal | June 1984 |
Hollow anode ion source
|
journal | January 1990 |
Hollow‐anode plasma source for molecular beam epitaxy of gallium nitride
|
journal | March 1996 |
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/315/118/313/
applying
argon
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below
chamber
constricted
constricted glow
contamination
deposition
detection
detection limit
detection limits
devices
difficult
discharge
discharge chamber
discharge plasma
discharged
disclosed
energy
enriching
films
gallium
gallium nitride
geometry
glow
glow discharge
limits
low-energy
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material surface
material surfaces
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metal film
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method
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minimized
mounted
nitride
nitrides
oxide
oxides
oxygen
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plasma
plasma source
polarity
practical
process
provide
providing
series
set
source
sources
substances
suitable
surfaces
sustained
tungsten
tungsten oxide
ultra
vapor
water
water vapor
applying
argon
assist
below
chamber
constricted
constricted glow
contamination
deposition
detection
detection limit
detection limits
devices
difficult
discharge
discharge chamber
discharge plasma
discharged
disclosed
energy
enriching
films
gallium
gallium nitride
geometry
glow
glow discharge
limits
low-energy
material
material surface
material surfaces
metal
metal film
metal films
method
methods
minimized
mounted
nitride
nitrides
oxide
oxides
oxygen
parallel
plasma
plasma source
polarity
practical
process
provide
providing
series
set
source
sources
substances
suitable
surfaces
sustained
tungsten
tungsten oxide
ultra
vapor
water
water vapor