Gated charged-particle trap

Patent · Fri Jan 01 00:00:00 EST 1999

OSTI ID:872183

Benner, W Henry ^[1]

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1. Danville, CA

The design and operation of a new type of charged-particle trap provides simultaneous measurements of mass, charge, and velocity of large electrospray ions. The trap consists of a detector tube mounted between two sets of center-bored trapping plates. Voltages applied to the trapping plates define symmetrically-opposing potential valleys which guide axially-injected ions to cycle back and forth through the charge-detection tube. A low noise charge-sensitive amplifier, connected to the tube, reproduces the image charge of individual ions as they pass through the detector tube. Ion mass is calculated from measurement of ion charge and velocity following each passage through the detector.

• Research Organization: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
• DOE Contract Number: AC03-76SF00098
• Assignee: Regents of University of California (Oakland, CA)
• Patent Number(s): US 5880466
• OSTI ID: 872183
• Country of Publication: United States
• Language: English

Related Subjects

gated
charged-particle
trap
design
operation
type
provides
simultaneous
measurements
mass
charge
velocity
electrospray
consists
detector
tube
mounted
sets
center-bored
trapping
plates
voltages
applied
define
symmetrically-opposing
potential
valleys
guide
axially-injected
cycle
forth
charge-detection
noise
charge-sensitive
amplifier
connected
reproduces
image
individual
pass
calculated
measurement
following
passage
simultaneous measurement
voltages applied
particle trap
simultaneous measurements
noise charge
trapping plate
provides simultaneous
charged-particle trap
detector tube
tube mounted
trap consists
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